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CMX3-DL
CMX3-DL
CMX3-DL
CMX3-DL
CMX3-DL
CMX3-DL
CMX3-DL
CMX3-DL CMX3-DL CMX3-DL CMX3-DL CMX3-DL CMX3-DL CMX3-DL

CMX3-DL : Material Coating & Thickness Gauge

The Dakota CMX3-DL is a top-of-the-line ultrasonic thickness gauge engineered for advanced inspection of material and coating thickness in demanding industrial environments. Designed with cutting-edge A/B scan technology, it provides real-time waveform and cross-sectional visualization, enabling accurate detection of corrosion, pits, flaws, and internal defects.

Built on a powerful 100 MHz DSP platform with FPGA technology, the CMX3-DL ensures high-speed signal processing and precise measurement performance. Its dual pulser and receiver system enhances signal clarity, while features such as automatic gain control (AGC) and adjustable time-dependent gain (TDG) allow users to fine-tune measurements for complex materials.

The standout feature of the CMX3-DL is its high-resolution AMOLED color display, offering superior clarity for A-Scan and B-Scan views. With a 60Hz refresh rate, it provides smooth, real-time imaging, making it easier to identify thickness variations and detect critical defects during inspection.

This enhanced visualization significantly improves decision-making, especially in safety-critical applications such as pipelines, pressure vessels, and structural components.

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CMX3-DL : Material Coating & Thickness Gauge
Features Specifications FAQ Downloads



Features
  • AMOLED Color Display: High-resolution color screen for superior A/B scan clarity and better waveform interpretation.
  • Advanced A/B Scan Technology: Real-time waveform (A-Scan) and cross-sectional (B-Scan) views for accurate flaw detection.
  • 100 MHz DSP Platform: High-speed processing ensures precise and reliable thickness measurements.
  • Dual Pulser & Receiver System: Enhanced signal quality for improved accuracy in complex materials.
  • Multiple Measurement Modes: Supports Pulse-Echo, Echo-Echo (thru paint), Coating Only, and more for versatile applications.
  • High-Speed Performance: Up to 250 Hz pulse repetition rate for faster inspections.
  • Automatic Gain Control (AGC): Optimizes signal strength for consistent and stable readings.
  • Wide Transducer Compatibility: Supports single, dual, delay line, and pencil probes (1–20 MHz).
  • 4GB Internal Memory: Store readings, waveforms, and screen captures for reporting and analysis.
  • USB-C Connectivity: Easy data transfer and PC interface for documentation.
  • Rugged & Portable Design: Durable aluminum body built for harsh industrial environments.
  • Long Battery Life: Efficient power management for extended field use.
Specifications
Features
 CMX3-DL
Display Type AMOLED Color
Screen Resolution 320 × 240 (1/4 VGA)
Screen Refresh Rate 60 Hz
Visualization Enhanced Color A/B Scan
User Experience Advanced, clearer waveform visibility
Battery Life Up to 12 hrs
Platform 100 MHz DSP
Channels Dual Pulser & Receiver
Pulse Repetition Rate Up to 250 Hz
Measurement Modes Same as CMX2-DL
Gain Range 110 dB with AGC
Memory 4 GB
Transducer Support Dual/Single (1–20 MHz)
Connectivity USB-C
Build Rugged Aluminum
Best For Advanced inspection requiring better visualization
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